Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes

1888PressRelease - Carbon Design Innovations, Inc.'s introduces new probe technology for high aspect ratio imaging with their new TN series.

San Francisco, CA - Every atomic force microscope (AFM) needs high aspect ratio (HAR) capability at least some of the time. The new TN series of HAR probes from Carbon Design Innovations, Inc. (CDI) are for samples 25nm or taller. TN probe technology is unlike any previous AFM probe in the market. All scanning probe microscope (SPM) and AFM probes of the TN series are made from a proprietary Carbon based composite material with the stability of Silicon but the toughness of Carbon. They are chemically inert and offer a highly reproducible long-lasting HAR probe. The tip is shaped like a needle with a circular cross-section.

Without TN Series tips from CDI your AFM data may be giving you the wrong image. Up to 60% or more of your collected data may be incorrect. AFM users become accustomed to tip-induced artifacts that plague most AFM images but TN series HAR tips eliminate 90% of these artifacts. If your sample is as flat as a crystal surface then you don't need an HAR tip. For everything else, you need CDI's TN line of probe tools for AFM.

TN tips last longer than Silicon tips, making your data more reliable scan to scan and cheaper to run on a cost per scan basis than even the "budget" probe options.

CDI TN Series probes are designed for non-contact or tapping™ mode imaging. This probe type combines high Aspect Ratio with outstanding Lifetime and High Resolution Intended measurements on samples with sidewall angles up to 90° the tips show a high aspect ratio portion of up to 2 microns with near-vertical sidewalls. Typical aspect ratios TN Series tips can be as high as 20:1. The half cone angle is typically

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