Komal Chauhan
Member since: Jul 14, 2020
Published articles: 1
Optimal Dft Design (Design for Testability) Solutions in 16Nm, 7Nm and Below Chips
Design for Testability (DFT), is one of the effective ways to overcome power consumption challenges and huge data volumes in the testing process after production, which has grown dramatically in lower...
Articles > Technology & Science > Electronics
Jul 18, 2020
Author Bio
Komal Chauhan works as a Digital Marketing Senior Executive at eInfochips where she supports digital marketing activities for various verticals - aerospace, DevOps, technical debt, semiconductor and silicon partnerships.